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MEASURE T^2
Mode Oct 2011 |
MEASURE (Scantraq) adds a transmission squared mode intended for variable angle transmission accessories. |
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User-Defined Functions Oct 2011 |
DESIGN User-Defined Functions/Targets have been upgraded and integrated with a new Calculator. |
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MONITOR Run-Time May 2011 |
Quickly estimate total coating run-time. Includes pumping time, rise time, cooling time. |
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MEASURE Spectra Backup Feb 2011 |
Ever forget to save a measured curve and then had to re-scan? The Spectra Backup Recorder auto-saves up to 9999 spectra. |
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Diabatic Transmittance Oct 2010 |
The Schott diabatic transmittance scale [1-log(log1/t)] conveniently displays passbands and blocking regions on the same graph. |
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Design Recorder Oct 2010 |
Ever lose a superior design while trying a new starting design or changing optimization variables? Turn on the Recorder! |
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Intellemetrics Support Sep 2009 |
New FilmStar MONITOR now supports Intellemetrics IL550 and IL560 automatic optical monitors. |
| HTML Help Sep 2009 |
WinHelp .hlp replaced by .chm. This provides means to seamlessly include FtgSoftware.com web pages within online help. |
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StellarNet Spectrometers Aug 2009 |
New FTG StellarNet Server supports StellarNet spectrometers for FilmStar DESIGN and MEASURE users. |
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PE
Spectrum 100 Oct 2008 |
New FilmStar MEASURE Spectrum server Sp100.exe supports the new PerkinElmer Spectrum 100 FTIR, including the Optica model configured for optics users (replaces GX). |
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Global Search Sep 2008 |
Global Search provides a method to determine new starting designs. Groups (layers within parentheses) and the FilmStar Workbook are supported. |
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PE Lambda 1050 Sep 2008 |
A new FilmStar MEASURE version Mpe1050 supports both the Triple Detector Module (+InGaAs for much improved near-IR performance) and Universal Reflectance Attachment. |
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Auxiliary Serial Communications Feb 2008 |
All versions of MEASURE now support serial communications with external devices. This provides means for users to integrate xy-stages, programmable logic controllers, etc. |
| Interactor
Updates Oct, Dec 2007 |
In October the Interactor added the important ability to vary material indices. The December update made it much easier to select layers in designs with many layers. |
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Layer Error Analyzer Mar 2007 |
This important facility lets users view layer errors determined by inverse-synthesis. It then generates FilmStar BASIC code to compensate for these errors. |
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Updated
FSPlot Module Mar 2007 |
FSPlot Module now uses GDI+. The benefits are superior monochrome printing and smoother (anti-alias) plot curves. |
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DESIGN
File Browser Mar 2007 |
A new File Properties browser makes it easy for larger facilities to manage designs. Users can select My Designs, etc. |
| Lambda 19
XP Support Sep 2006 |
A new version of MEASURE (Scantraq) supports PE Lambda 18-19 under Win 2000/XP. The required Lambda AX PCI board and cable assembly is available from FTG Software. |
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DESIGN
Interactor May 2006 |
FilmStar DESIGN 2.50 adds a secondary main screen which lets users interactively adjust designs and instantly plot results. |
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PE URA Support Apr 2006 |
A new version of MEASURE (Scantraq) supports PE 650-950 with URA (Universal Reflectance Accessory) |
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Hitachi
Support Jan 2006 |
A new version of MEASURE (Scantraq) supports Hitachi U-3210 and U-3410 (aka U-3200, 3400) |
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Zeiss MCS 500 Support Aug 2005 |
The FTG Zeiss MCS5 ActiveX Server adds DAQ from Zeiss MCS 500 Series spectrometers in DESIGN and MEASURE. |
| ODX
Support Jun 2005 |
Import/export of ODX (Optical Design eXchange) XML design files and materials files (*.odx) |
| SYRUSpro
Support Jun 2005 |
Support in FilmStar DESIGN, INDEX and MONITOR for Leybold SYRUSpro includes creation of XML file and automatic entry of Leybold defined dispersive index functions. As part of this effort, FilmStar BASIC was added to MONITOR. |
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Mixed
Materials Apr 2005 |
Index formulas can now be a function of up to three dispersive tables. |
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FilmStar Database Apr 2005 |
New FilmStar Database technology based on FileMaker Pro 7 replaces the previous Access-based module. |
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PE Spectrum One Feb 2005 |
A new ActiveX server enables MEASURE (Scantraq) to control the PerkinElmer Spectrum One FTIR spectrometer. |
| Code
Generators Feb 2005 |
BASIC code creators for FSPlot annotations and the Report Generator ease the task of reproducing plots and reports. |
| Cary
Accessories Jul 2004 |
In MEASURE (Scantraq) for Cary, FilmStar BASIC adds several functions (CaryAccy...) for controlling accessories. |
| New
Materials Models Apr 2004 |
Forouhi-Bloomer and Tauc-Lorentz dispersion models added to DESIGN and INDEX. |
| Upgraded
DLS Feb 2004 |
The DLS (damped least squares) optimizer has been improved by implementing a new matrix inversion algorithm. |
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User-Defined Targets Oct 2003 |
User-defined functions of reflectance, transmittance and phase can be utilized as optimization targets. |
| IC/5 DAQ Package Jul 2003 |
IC/5 Data Logger and IC/5 Data Plotter allow users to acquire and display Rate, Power and Thickness vs. time. This diagnostic tool is available to MONITOR and CRYSTAL users. |
| FilmStar Administrator Jun 2003 |
A
FilmStar Administrator bit can be added to HASP Security
ID Modules. The Administrator can then set numerous security options on
users' computers.
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| New
Materials Models Jun 2003 |
Maxwell-Garnett and Bruggeman mixed materials models have been added to User-Defined index functions. |
| Birefringent Indices Feb 2003 |
New user-defined index variables IFP (if P pol) and IFS (if S pol) make it easy to set up birefringent materials |
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Updated
FSPlot Module Oct 2002 |
An updated FSPlot Module offers finer control over graph details and provides new web graphics enhancements. A major enhancement is the ability to add a data table to plots. |
| MONITOR Export Chip May 2002 |
As an aid in reverse-engineering, Evaluate...Export Chip <Ctrl+X> exports the film stack on a selected monitor chip to DESIGN (which must be open). |
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New
File Dialogs Apr 2002 |
Default FTG-style file open/save dialogs can be replaced by Windows common dialogs. |
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Extended
Materials Feb 2002 |
Setting Film Indices (in File Configuration Capacity) to a number n > 52 places DESIGN into Extended Materials mode |
| Updated User-Interface Jan 2002 |
New toolbars and property dialogs offer a new level of convenience; graph properties may be updated all at once, etc. In addition, standard Windows dialog fonts can replace FTG-style bold fonts. |
| Flip-Flop Synthesis Nov 2001 |
The flip-flop method, pioneered by W. H. Southwell has been implemented. Users can specify a starting design and flip multiple layer elements. |
| PDF, RTF Reports Sep 2001 |
The Report Generator now saves documents in the popular Adobe Acrobat .pdf format. Previous binary files (.prt) can be converted. Documents can also be saved in Rich Text Format (.rtf) and opened and edited in MS Word. |
| Genetic Evolution Jul 2001 |
New genetic algorithms provide methods for synthesizing and refining thin film designs. You can, for example, design coatings containing quarter waves or near quarter waves. |
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Index
Functions Jun 2001 |
New and improved dispersive Index Functions provide users with the means to minimize differences between measured and calculated results. |
| Phase Dispersion Functions Apr 2001 |
DESIGN evaluates and optimizes several phase dispersion functions: Group Delay, Group Delay Dispersion, Chromatic Dispersion. These are supported in both reflectance and transmittance. |
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Fast
Eddy Apr 2001 |
New support for Eddy Company LMC-10/20 light monitors offers Fast Eddy data transfer and much improved handling of process information. |
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Encrypted
Designs Mar 2001 |
Design encryption allows your customers to evaluate your designs without being able to modify or view them. You will want to test this feature and let us know if there are any problems with it. |
| Link Variables Feb 2001 |
Optimization variables may be linked. (Linked variables retain the same optical or physical thickness ratio during optimization.) This makes it easier to design devices based on quarter wave stacks. Other optimization improvements include thickness and index limits. |
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Unobtainium Nov 2000 |
Hypothetical film unobtainium adds an ideal AR to designs with massive layers. This helps users deal with embedded light sources, etc. |
| Updated BASIC Nov 2000 |
New properties, functions and subroutines enable users to develop BASIC code without DDE Macro commands. A main advantage is that all keywords are defined and documented in object browsers. |
| PE Spectrum BX Jul 2000 |
DDE server S1000svr.exe allows MEASURE (Scantraq) 32-bit to communicate with Spectrum BX (1000) drivers under Win 95/98/NT. |
| Sopra .nk Import May 2000 |
Import Sopra .nk index files into INDEX. |
| PE Spectrum GX Mar 2000 |
DDE server S2000svr.exe allows MEASURE (Scantraq) 32-bit to communicate with Spectrum GX (2000) drivers under Win 95/98/NT. |
| Varian Cary Support Feb 2000 |
New MEASURE (Scantraq) executable Mcary5_32.exe supports Varian Cary 1-5 (100-500) spectrophotometers. |
| Wavelength Calibration Jan 2000 |
MEASURE (Scantraq) adds automatic compensation for monochromator wavelength errors. |
| MONITOR Simulator Oct 1999 |
The Simulator enables users to predict the effects of cutoff (overshoot) strategies in the production of bandpass filters. This is especially useful for DWDM designs. |
| Contour Plots, etc. Jul 1999 |
An updated graphics engine enables DESIGN to plot 2D graphs displaying R,T vs. wavelength and angle. FilmStar BASIC supports multiple sheets allowing several *.bas files to be open at the same time. The HASP Security ID Module is being shipped with new orders. |
| Lambda 19 Support Jul 1999 |
DDE server L19svr.exe allows MEASURE (Scantraq) 32-bit to communicate with P-E 19 drivers under Win 95/98. NT users should contact us. |
| Ocean Optics Server Jun 1999 |
Using ActiveX server Ocean1.exe, spectra from Ocean Optics spectrometers can be acquired by DESIGN, MEASURE or Excel. Please contact us about other CCD spectrometers. |
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The Coating
Game © May 1999 |
The MONITOR Coating Game (32-bit only) is an interactive simulator for developing optical monitoring skills. Intended for technicians who may not be familiar with thin film software, it uses a virtual instrument interface with a realistic strip chart, knobs, buttons and switches. |
